Advanced Materials Characterization Techniques (Analytical)

From Microscopy to Spectroscopy: A Comprehensive Approach, Electron Microscopy, Thermal analysis, X-ray Diffraction

4.7

(70 đánh giá)

272 học viên

Giảng viên

Khurshid Ayub

Phụ đề Việt chất lượng cao Phụ đề tiếng Anh Bán chạy Đánh giá cao

50.000đ 399.000đ -87%

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Bao gồm phụ đề tiếng Việt, tiếng Anh

8.0 giờ video

42 bài giảng

Truy cập vĩnh viễn

Học trên mọi thiết bị

Cập nhật: 31/05/2026

#Characterization #Materials #Science #Teaching & Academics

Bạn sẽ học được gì

Students will learn the fundamental principles of various advanced materials characterization techniques and describe their applications in Materials analysis

Develop the ability to understand and explain results produced by advanced materials characterization techniques

Students will be able to critically assess and select appropriate characterization techniques for different types of materials based on strengths and limitatons

Students will apply advanced characterization techniques to solve real-world materials challenges, demonstrating critical thinking and problem-solving skills

Yêu cầu

No Specific Pre-Requisite. A general science background knowledge is sufficient

Đối tượng phù hợp

The course aims to provide a comprehensive understanding of advanced materials characterization techniques, enabling students to leverage these methods to advance their research, enhance material performance, and contribute to technological innovations. This course is particularly helpful for: Graduate Students, Research Professionals, Materials Scientists, Materials Engineers and Interdisciplinary scientist

Nội dung khóa học

11 phần • 42 bài giảng

1 Introduction

1 Introduction and Development of Electron Microscopy

2 Kanaya Okayama Formula and Electron Matter interactions

3 SEM Instrumentation and Working Principle

4 SEM Instrumentation

5 Transmission Electron Microscopy (TEM) Instrumentation and Working Principle

6 Comparison of SEM and TEM

1 Atomic force microscopy (AFM)-Atomic Forces

2 Principle of AFM

3 working of AFM

4 Modes of AFM and comparison with other microscopies

5 Limitations and Applications of AFM

1 XPS- Photoelectric effect and X-rays

2 Binding energy, kinetic energy and work function

3 XPS-Instrumentation

4 Phenomenon associated with XPS

5 Chemical Shifts and Spin Orbit Coupling

6 Final Shake Up and Shake off Effects

7 Angle Resolved XPS

1 Raman Spectroscopy, Raman Effects (Stokes and anti-Stokes Shift)

2 Comparison of Raman with IR

3 Raman Instrumentation

1 Electron Energy Loss Spectroscopy

2 Surface Plasmons and High energy Loss region

3 White lines, Fine Edge Structure in XPS, Applications and Comparison with EDX

4 EELS Spectral Analysis

1 EDX, Mechanism and Production of X-ray

2 EDX Instrumentation

3 EDX Instrumentations II and Applications of EDX

1 XRD principle and Bragg's Equation

2 XRD Instrumentation and Transmission Laue Method

3 Rotating Crystal method and Powder method of XRD

4 Spectral analysis of XRD and Small and Wide anlge Scattering (SAXS, WAXS)

1 Working Principle of TGA

2 Instrumentaton of TGA with NULL and DEFLECTION Balanaces

3 TGA instrumentation and factors affecting TGA Curve

4 How to perform sample analysis on TGA

1 DTA principle, and Instrumentation

2 DTA applications, factors affecting the analysis

1 Principle of DSC, DSC Types and Power Compensaton method

2 Heat Flux Method and DSC Curves

3 Factors affecting DSC and Applications of DSC

Giới thiệu khóa học

This course provides an in-depth exploration of cutting-edge techniques used to characterize materials at the micro and nanoscale. Designed for graduate students and professionals in materials science, engineering, and related fields, the course will cover a range of advanced characterization methods, including:

Electron Microscopy: Techniques such as Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM), Auger Electron Microscopy for high-resolution imaging and analysis.
X-ray Diffraction (XRD
Spectroscopic Methods: in depth understanding of spectroscopic techniques like Raman Spectroscopy, energy dispersive x-ray spectroscopy, and x-ray photoelectron spectroscopy.
Thermal Analysis: Exploring Differential Scanning Calorimetry (DSC), differential thermal analysis (DTA) and Thermogravimetric Analysis (TGA) to study thermal properties.
Atomic Force Microscopy: Microscopy at the level will be studied through Atomic force microscopy commonly known as AFM.

Through a series of lectures, and case studies, students will gain practical experience in selecting and applying the appropriate characterization techniques for various materials. The course will also emphasize the importance of data interpretation and the role of advanced characterization in materials development and innovation.

By the end of the course, participants will be equipped with the skills and knowledge necessary to conduct comprehensive materials characterization, enabling them to contribute to advancements in material design and application across multiple industries. This course focuses on principles, instrumentation concepts, and interpretation, rather than hands-on operation or laboratory training on the instruments.